Interface structural evolution of YBa2Cu3Ox from a randomly oriented silver alloy substrate

Citation
Dl. Shi et al., Interface structural evolution of YBa2Cu3Ox from a randomly oriented silver alloy substrate, PHYSICA C, 353(3-4), 2001, pp. 258-264
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
353
Issue
3-4
Year of publication
2001
Pages
258 - 264
Database
ISI
SICI code
0921-4534(20010515)353:3-4<258:ISEOYF>2.0.ZU;2-D
Abstract
In our previous work we have obtained YBCO thick films on silver alloy subs trate (SAS) via the peritectic solidification. To identify the underlying m echanism of YBCO grain growth at the substrate interface, extensive transmi ssion electron microscopy experiments were carried out in this study. A thi n "buffer" of 300 nm thickness was observed between the YBCO film and the S AS. This "buffer" was identified to be essentially the YBCO structure, howe ver lacking of the superlattice. Initially randomly oriented, these small c rystallites in the buffer gradually grow into a large grain of YBCO within the polycrystalline film. The underlying mechanism of crystal evolution on an unoriented substrate is discussed. (C) 2001 Elsevier Science B.V. All ri ghts reserved.