Yl. Soo et al., Local structure around Fe in the diluted magnetic semiconductors Ga1-xFexAs studied by x-ray absorption fine structure - art. no. 195209, PHYS REV B, 6319(19), 2001, pp. 5209
Extended x-ray absorption fine structure and near-edge x-ray absorption fin
e structure techniques are employed to investigate the local structure and
valency about Fe atoms in the diluted magnetic alloy semiconductor system G
a1-xFexAs prepared by molecular-beam epitaxy under various conditions. This
experiment is aimed at elucidating possible correlations between the micro
structures in these diluted magnetic semiconductors and some physical prope
rties. Our x-ray results offer direct evidence of Fe substitution for Ga si
tes in GaAs prepared at relatively low substrate temperatures, wherein the
Ga1-xFexAs compound is mainly paramagnetic. However, the Fe impurity atoms
could form small Fe clusters and/or Fe-As complexes when the samples are gr
own at high temperatures.