Heat-flux induced changes to multicrystalline D-2 surfaces - art. no. 195416

Phase-shifting interferometry reveals that a heat flux normal to the gas-so lid interface reduces the surface roughness of thick (10-300 mum) multicrys talline D-2 films. The initial roughness, caused by misaligned crystals and grain boundaries produced during the initial random nucleation and rapid c rystal growth used in the experiment decreases with increasing heat flux. A simple energy minimization model quantitatively explains the functional re lationship between surface roughness and heat flux.