The application of resonant sensors such as quartz crystal microbalance (QC
M) resonators requires interface electronics to measure parameters that cha
racterize sufficiently the resonant behavior of the sensor due to effects u
nder investigation. Common oscillators as sensor electronics have two major
disadvantages. Since they measure the resonant frequency shift as the only
parameter their employment is restricted to mass sensing of thin and rigid
films in terms of QCM. Because of spurious phase shifts the measured reson
ant frequency may be erratic. In order to characterize the sensor itself or
a material on the sensor surface more parameters such as damping are to be
measured. Therefore, a sensor electronics was developed that precisely acq
uires the impedance spectrum of the resonant sensor in a small frequency ra
nge which reflects properties like thickness of a sensor coating, its densi
ty, and shear moduli or the density-viscosity product when measuring in liq
uids. Originally developed as a sensor interface electronics this novel dev
ice can help researchers to investigate any effects or material parameters
affecting the impedance spectrum of the sensor. In this article the measure
ment concept of the network analysis based device will be explained followe
d by details of realization on single printed cardboard. Measurement errors
are estimated by simulation and by a comparison of measurement results fro
m a commercially available network analyzer as a reference. Examples of lab
oratory and industrial applications will be given. (C) 2001 American Instit
ute of Physics.