Device model for quantum dot infrared photodetectors and their dark-current characteristics

Citation
V. Ryzhii et al., Device model for quantum dot infrared photodetectors and their dark-current characteristics, SEMIC SCI T, 16(5), 2001, pp. 331-338
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
5
Year of publication
2001
Pages
331 - 338
Database
ISI
SICI code
0268-1242(200105)16:5<331:DMFQDI>2.0.ZU;2-K
Abstract
We propose a device model for quantum dot infrared photodetectors (QDIPs) w ith relatively large lateral spacing between QDs as occurs in QDIPs fabrica ted and experimentally investigated recently. The developed model accounts for the self-consistent potential distribution and features of the electron capture and transport in realistic QDIPs in dark conditions. The model is used for the calculation of the dark current as a function of the structura l parameters, applied voltage and temperature. It explains a rather sharp i ncrease in the dark current with increasing applied voltage and its strong sensitivity to the density of QDs and the doping level of the active region . The calculated dependences are in good agreement with available experimen tal data. The obtained characteristics of QDIPs are compared to those of QW IPs with similar parameters.