Research and development of displays and image sensors based on semiconduct
ing polymers require design of new polymer materials and evaluation of film
properties. Application of statistical methods can expedite process develo
pment, Optimizing device performance entails determining the effect of seve
ral process parameters, necessitates numerous samples, and may consume more
scarce new material than desired. Uniform film thickness, with no voids, p
inholes, inhomogeneities, or particulate contamination across the substrate
can improve display efficiency and uniformity. After performing and analyz
ing a two-cubed full-factorial experiment with three replicated center poin
ts, this paper concludes that spin velocity and polymer concentration have
statistically significant effects on film thickness, film uniformity, and d
evice efficiency. Ramp acceleration does not. Analysis of variance methodol
ogy determines the effect of the three spin coating factors and their two-w
ay interactions.