Photoconductivity in ultrathin oligo(phenylene vinylene) films during vapor deposition

Authors
Luer, L Egelhaaf, HJ Oelkrug, D
Citation
L. Luer et al., Photoconductivity in ultrathin oligo(phenylene vinylene) films during vapor deposition, SYNTH METAL, 119(1-3), 2001, pp. 621-622
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779 → ACNP
Volume
119
Issue
1-3
Year of publication
2001
Pages
621 - 622
Database
ISI
SICI code
0379-6779(20010315)119:1-3<621:PIUOVF>2.0.ZU;2-4
Abstract
The photoconductivity (PC) of oligo(phenylene vinylene) (OPV) films during vapor deposition was measured as a function of the chain length of the OPV molecules. The films show PC even in sub nanometer thicknesses immediately after deposition. With short OPVs, the PC vanishes completely within 10 min utes, whereas with longer OPVs, the PC signal keeps rising after deposition . By comparison with optical absorption, luminescence and light scattering experiments, we show that the effects can be ascribed to a transformation f rom amorphous films to aggregates and microcrystallites.