Texture and grain structure in polycrystalline silver films deposited by partially ionised beam

Authors
Adamik, M Barna, PB Tomov, I
Citation
M. Adamik et al., Texture and grain structure in polycrystalline silver films deposited by partially ionised beam, VACUUM, 61(2-4), 2001, pp. 251-255
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
61
Issue
2-4
Year of publication
2001
Pages
251 - 255
Database
ISI
SICI code
0042-207X(20010514)61:2-4<251:TAGSIP>2.0.ZU;2-3
Abstract
The analysis of grain growth mechanisms is carried out by the investigation of the correlation between texture and average grain size in polycrystalli ne silver films deposited by e-beam evaporation. The results indicate that the ion bombardment can enhance the texture evolution by changing the drivi ng force for abnormal grain growth. This effect is attributed to the enhanc ed desorption of impurities from the free surface of the films due to ion b ombardment. (C) 2001 Elsevier Science Ltd. All rights reserved.