Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis
T. Babeva et al., Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis, APPL OPTICS, 40(16), 2001, pp. 2675-2681
We select the best combinations of spectrophotometric quantities far the mo
st accurate determination of the optical constants, n (refractive index), k
(absorption coefficient), and the thicknesses of thin absorbing films. The
basic comparative criteria used are the maximum absolute errors in the det
ermination of n, k, and d that result from experimental errors in photometr
ic measurements and in the optical constants of the substrates. We studied
all possible combinations of photometric quantities T, T-s(theta), T-p(thet
a), R, R-s(theta), R-p(theta), R-m, R-ms(theta), and R-mp(theta), at 0 degr
ees < theta less than or equal to 70 degrees where T denotes transmission;
R, reflection; the subscripts s and p, s- andp-polarized light; m, reflecti
on from a thin film coated upon an opaque substrate; and superscript theta,
the angle of incidence of light. The absence of the subscripts s and p imp
lies nonpolarized light; that of the subscript m, a nonabsorbing substrate;
and that of superscript theta, normally incident light. The error analysis
that is made admits the following conclusions: (1) The best double combina
tions are (TR), (TRm), (TRp70), and (TRmp70); (2) the best triple combinati
ons are (TRRm), (TRRp70), (TRRmp70), (TRmRp70), and (TRmRmp70); (3) the met
hods indicated above, suitably combined, are quite sufficient to provide th
e maximum accuracy and reliability of n, h, and d for all practical situati
ons; (4) TRR methods based on measurements with obliquely polarized light a
re more suitable for thin films with n < 1, such as some metal films; (5) t
he regions of n, k, and d/<lambda> with the highest and the lowest accuraci
es do not overlap in either the TR or the TRR methods. Hence more combinati
ons, preferably all, should be applied for the most accurate determination
of n, h (and d), and the errors should be evaluated as a criterion for the
best combination. (C) 2001 Optical Society of America.