Electronic properties of mechanically induced kinks in single-walled carbon nanotubes

We have used an atomic-force microscope tip to mechanically buckle single-w alled carbon nanotubes. The resistance of the induced defects ranged from 1 0 to 100 k Omega and varied with the local Fermi level, as determined by sc anned-gate microscopy. By forming two closely spaced defects on metallic na notubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to similar t o 165 K. (C) 2001 American Institute of Physics.