The influence of proton irradiation on properties of commercial single
-quantum-well AlGaN/InGaN/GaN green-light emitting diodes is studied.
A dose of 2.3Mrad degraded the room-temperature light emission from th
e irradiated area of the device, while the electrical device character
istics remain practically unchanged. At low temperatures (similar or e
qual to 15K), however, the light emission recovers almost entirely, in
dicating the formation of a nonradiative recombination channel within
the active layer of the device.