Studies on interface structure of BBDMS-PPV/ITO system using ADXPS technique

Citation
Wj. Song et al., Studies on interface structure of BBDMS-PPV/ITO system using ADXPS technique, CHEM J CH U, 22(5), 2001, pp. 836-838
Citations number
13
Categorie Soggetti
Chemistry
Journal title
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
ISSN journal
02510790 → ACNP
Volume
22
Issue
5
Year of publication
2001
Pages
836 - 838
Database
ISI
SICI code
0251-0790(200105)22:5<836:SOISOB>2.0.ZU;2-Z
Abstract
We analyzed the structure of buried interface of BBDMS-PPV/ITO system using a high resolution ADXPS technique. A transitional layer structure, whose c hemical composition, state and valence band changed gradually from BBDMS-PP V surface of film to substrate ITO, was observed. It was found that O2- ion from ITO diffused into polymer film, interacted with back-bone carbon and formed the carbonyl bonding which could possibly constructed the channel of the carrier on the heterointerface. Indium of ITO also diffused into BBDMS -PPV layer and In(OH)(3) was formed during diffusion. The diffusion and rea ction between PPV/ITO interface may affect the performance of PLED signific antly.