Experimental demonstration of a silicon carbide IMPATT oscillator

Citation
L. Yuan et al., Experimental demonstration of a silicon carbide IMPATT oscillator, IEEE ELEC D, 22(6), 2001, pp. 266-268
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
22
Issue
6
Year of publication
2001
Pages
266 - 268
Database
ISI
SICI code
0741-3106(200106)22:6<266:EDOASC>2.0.ZU;2-9
Abstract
Silicon carbide (SiC) is an excellent material for high-power and high-freq uency applications because of its high critical field, high electron satura tion velocity, and high thermal conductivity, In this letter, we report the first experimental demonstration of microwave oscillation in 4H-SiC impact -ionization-avalanche-transit-time (IMPATT) diodes. The prototype devices a re single-drift diodes with a high-low doping profile. DC characteristics e xhibit hard, sustainable avalanche breakdown, as required for IMPATT operat ion. Microwave testing is performed in a reduced-height waveguide cavity, O scillations are observed at 7.75 GHz at a power level of 1 mW.