Low-frequency dielectric relaxation near the curie temperature in triglycine sulfate crystals containing radiation-induced defects and alpha-alanine impurity
Lg. Bradulina et al., Low-frequency dielectric relaxation near the curie temperature in triglycine sulfate crystals containing radiation-induced defects and alpha-alanine impurity, INORG MATER, 37(5), 2001, pp. 510-514
The dielectric properties of a polydomain triglycine sulfate (TGS) crystal
near the Curie temperature (20 Hz to 20 kHz) were compared with those of mo
nodomain crystals (containing alpha -alanine impurity or gamma-irradiated).
The frequency and temperature dependences of ac conductivity were used to
assess its effect on the dielectric properties of TGS near T-C. The crystal
s were found to differ in the variation of the real part of permittivity wi
th temperature, which was tentatively attributed to the difference in the d
ensity of domain walls in the paraelectric phase near T-C.