Low-frequency dielectric relaxation near the curie temperature in triglycine sulfate crystals containing radiation-induced defects and alpha-alanine impurity

Citation
Lg. Bradulina et al., Low-frequency dielectric relaxation near the curie temperature in triglycine sulfate crystals containing radiation-induced defects and alpha-alanine impurity, INORG MATER, 37(5), 2001, pp. 510-514
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INORGANIC MATERIALS
ISSN journal
00201685 → ACNP
Volume
37
Issue
5
Year of publication
2001
Pages
510 - 514
Database
ISI
SICI code
0020-1685(200105)37:5<510:LDRNTC>2.0.ZU;2-E
Abstract
The dielectric properties of a polydomain triglycine sulfate (TGS) crystal near the Curie temperature (20 Hz to 20 kHz) were compared with those of mo nodomain crystals (containing alpha -alanine impurity or gamma-irradiated). The frequency and temperature dependences of ac conductivity were used to assess its effect on the dielectric properties of TGS near T-C. The crystal s were found to differ in the variation of the real part of permittivity wi th temperature, which was tentatively attributed to the difference in the d ensity of domain walls in the paraelectric phase near T-C.