Thermal and electrical properties of Czochralski grown GeSi single crystals

Citation
I. Yonenaga et al., Thermal and electrical properties of Czochralski grown GeSi single crystals, J PHYS CH S, 62(7), 2001, pp. 1313-1317
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
ISSN journal
00223697 → ACNP
Volume
62
Issue
7
Year of publication
2001
Pages
1313 - 1317
Database
ISI
SICI code
0022-3697(200107)62:7<1313:TAEPOC>2.0.ZU;2-X
Abstract
The thermoelectric parameters, thermal conductivity, electrical conductivit y and Seebeck coefficient of high quality single crystals of Ge1-xSix alloy s in various composition of 0.8 < x < 1, were investigated in the temperatu re range 300-1000 K for application to a high performance thermoelectric de vice. Single crystals of the alloys of heavily impurify-doped were grown by the Czochralski technique. The thermal conductivity was mainly controlled by phonon scattering, showing a minimum at x = 0.5-0.6. The electrical cond uctivity of alloys was well controlled to be almost constant with a high ma gnitude by the suitable doping level. The Seebeck coefficient was 300-400 m uV/K at 600 degreesC in the impurity-doped GeSi alloys. The dependence of t he Seebeck coefficient on the electrical conductivity was revealed. The dim ensionless figure of merit of 0.65 was evaluated in the impurity-doped sing le crystals of GeSi alloys. (C) 2001 Elsevier Science Ltd. All rights reser ved.