Electron spectrometry at the mu eV level and the electron affinities of Siand F

Authors
Blondel, C Delsart, C Goldfarb, F
Citation
C. Blondel et al., Electron spectrometry at the mu eV level and the electron affinities of Siand F, J PHYS B, 34(9), 2001, pp. L281-L288
Citations number
28
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
ISSN journal
09534075 → ACNP
Volume
34
Issue
9
Year of publication
2001
Pages
L281 - L288
Database
ISI
SICI code
0953-4075(20010514)34:9<L281:ESATME>2.0.ZU;2-7
Abstract
Photodetachment microscopy of the negative ions Si- and F- has made it poss ible to measure the electron affinities of silicon and fluorine with improv ed accuracy. The new recommended electron affinities of Si-28 and F-19 are 11207.252(18) and 27432.446(19) cm(-1), i.e. 1.3895220(24) and 3.401 1895(2 5) eV, respectively.