Calibration of an optical fluorescence method for film thickness measurement

Citation
Ac. Jones et al., Calibration of an optical fluorescence method for film thickness measurement, MEAS SCI T, 12(5), 2001, pp. N23-N27
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
MEASUREMENT SCIENCE & TECHNOLOGY
ISSN journal
09570233 → ACNP
Volume
12
Issue
5
Year of publication
2001
Pages
N23 - N27
Database
ISI
SICI code
0957-0233(200105)12:5<N23:COAOFM>2.0.ZU;2-M
Abstract
We describe the calibration of a technique allowing quantitative measuremen ts of industrial coatings with thicknesses as small as 10-20 nm, Wax films doped with fluorescent rhodamine dye have been deposited by an electrospray method onto an optically flat surface of aluminium-coated glass. The films were of 220-450 nm peak thickness, which we measured with an optical profi lometer using laser triangulation. Possession of a set of films allowing an absolute calibration of the fluorescence intensity versus thickness to be achieved for application in trials of the fluorescence method for measuring coating thicknesses of 10-20 nm under industrial process conditions.