Diffraction and depths-of-field effects in electron beam imaging at SURF III

Authors
Citation
U. Arp, Diffraction and depths-of-field effects in electron beam imaging at SURF III, NUCL INST A, 462(3), 2001, pp. 568-575
Citations number
13
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
462
Issue
3
Year of publication
2001
Pages
568 - 575
Database
ISI
SICI code
0168-9002(20010421)462:3<568:DADEIE>2.0.ZU;2-D
Abstract
Imaging an electron beam with visible light is a common method of diagnosti cs applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the Synchrotron Ultraviolet Radiation Facility (SURF) I II at the National Institute of Standards and Technology (NIST) were studie d over an extended period of time to characterize the upgraded accelerator. There is good agreement between experimental and theoretical horizontal be am sizes at three different electron energies. (C) 2001 Elsevier Science B. V. All rights reserved.