Nanoscale defect formation on InP surface by swift gold ion impact

Authors
Singh, JP Singh, R Mishra, NC Ganesan, V Kanjilal, D
Citation
Jp. Singh et al., Nanoscale defect formation on InP surface by swift gold ion impact, NUCL INST B, 179(1), 2001, pp. 37-41
Citations number
18
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
179
Issue
1
Year of publication
2001
Pages
37 - 41
Database
ISI
SICI code
0168-583X(200106)179:1<37:NDFOIS>2.0.ZU;2-3
Abstract
The atomic force microscopy (AFM) was used to image nanoscale defect on InP surface induced by 100 MeV Au8+ ions. These defects manifest themselves as pits or hillocks in AFM images depending on the scan direction. The nuclea r energy loss (S-n) of swift heavy ion was found to be a decisive parameter for the creation of nanoscale defects, which otherwise supposed to be negl ected at the surface for inelastic electronic energy loss (S-e) dominant pr ocesses. (C) 2001 Elsevier Science B.V. All rights reserved.