Multilayer mirror for x rays below 190 eV

Citation
C. Michaelsen et al., Multilayer mirror for x rays below 190 eV, OPTICS LETT, 26(11), 2001, pp. 792-794
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
26
Issue
11
Year of publication
2001
Pages
792 - 794
Database
ISI
SICI code
0146-9592(20010601)26:11<792:MMFXRB>2.0.ZU;2-4
Abstract
La/B4C multilayers have been fabricated by magnetron sputtering for use as x-ray mirrors at energies below 190 eV, particularly for detection of boron K and alpha x rays at 183 eV, their performance has been compared with tha t of Mo/B4C multilayers, which are currently the best-performing multilayer s for this energy range. Transmission electron microscopy and synchrotron s oft-x-ray reflectometry were used to study the structural quality of the mu ltilayers and their performance as x-ray mirrors. The results show a signif icant improvement of the peak reflectivity and the spectral purity, indicat ing that La/B4C has a high potential to replace Mo/B4C in many x-ray optica l applications below 190 eV. (C) 2001 Optical Society of America.