Properties of ferromagnetic (Ga,Mn)As layers grown epitaxially on a GaAs (4
1 1)A substrate were investigated. X-ray double-crystal diffraction showed
the presence of shear strain due to lattice mismatch between substrate and
the epitaxial layer. The magnetotransport measurements showed that the eas
y axis of magnetization was in the (1 0 0) plane. The results indicate that
the origin of the magnetic anisotropy is dominated by the lattice strain.
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