Automation for 300mm fabs absolutely requires comprehensive attention to th
e interrelationships between the four levels of automation: FOUPs and wafer
-handling automation, tool frontend automation, intrabay automation, and in
terbay automation. The complexity of the manufacturing sequence continues t
o grow at a rapid pace, meaning more layers, more vertical circuit integrat
ion, and the need for faster feedback from metrology measurement to provide
real-time process feed-forward and feed-backward process control.