Tip effects in the scanning-tunneling microscopy of semiconductor electrodes

Citation
R. Hiesgen et al., Tip effects in the scanning-tunneling microscopy of semiconductor electrodes, SURF SCI, 479(1-3), 2001, pp. 183-190
Citations number
17
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
479
Issue
1-3
Year of publication
2001
Pages
183 - 190
Database
ISI
SICI code
0039-6028(20010520)479:1-3<183:TEITSM>2.0.ZU;2-#
Abstract
The surface properties of a WSe2 electrode have been investigated with a sc anning-tunneling microscope in an electrochemical cell. Current-potential c urves have been obtained for various electrode potentials and tunneling dis tances. They show a strong influence of the tip on the local electrode pote ntial. The main features can be understood within a simple model describing the distribution of the electrostatic potential and its effect on the loca l electronic density. (C) 2001 Elsevier Science B,V. All rights reserved.