Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

Citation
G. Salvan et al., Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements, APPL SURF S, 175, 2001, pp. 363-368
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
175
Year of publication
2001
Pages
363 - 368
Database
ISI
SICI code
0169-4332(20010515)175:<363:COPFOS>2.0.ZU;2-O
Abstract
Optical spectroscopies: Raman, infrared (IR) and photoluminescence (PL) wer e used to investigate the influence of the substrate temperature on the him formation of the organic molecule 3,4,9,10-perylenetetracarboxyl dianhydri de (PTCDA) on hydrogen-passivated silicon(1 0 0) substrates. Raman spectra exhibit four phonon bands below 125 cm(-1), indicating the crystalline natu re of the films. The spectral changes of both Raman- and infrared-active mo des reflect that the size of the individual crystals increases with the sub strate temperature during growth. Moreover, they support an increase in the content of the alpha -phase at the expense of the beta -phase. The rising background in the high frequency range of the Raman spectra is related to a n enhancement of the PL efficiency connected to a reduced number of non-rad iative centres of recombination. Time-resolved PL measurements reveal that the PL decay time increases with the substrate temperature, approaching the value characteristic for a PTCDA single crystal. (C) 2001 Elsevier Science B.V. All rights reserved.