Contact resonance imaging - a simple approach to improve the resolution ofAFM for biological and polymeric materials

Citation
K. Wadu-mesthrige et al., Contact resonance imaging - a simple approach to improve the resolution ofAFM for biological and polymeric materials, APPL SURF S, 175, 2001, pp. 391-398
Citations number
40
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
175
Year of publication
2001
Pages
391 - 398
Database
ISI
SICI code
0169-4332(20010515)175:<391:CRI-AS>2.0.ZU;2-3
Abstract
It is frequently observed that high resolution is difficult to achieve when using atomic force microscopy (AFM) to image "soft-and-sticky" surfaces, s uch as polymers and biomaterials. A new and simple method, contact resonanc e imaging (CRI), is introduced to address these issues. In CRI, the sample is modulated at a resonance frequency of the tip-sample contact, while the average position of the tip still remains in contact with the surface, i.e. in the repulsive region of the force-distance curve. The improvement in im age resolution is demonstrated using various biological and polymeric speci mens under ambient laboratory conditions and in liquid media. The possible mechanism of the resolution improvement is discussed in comparison to other techniques, such as tapping-mode imaging. (C) 2001 Elsevier Science B.V. A ll rights reserved.