Low energy electron-excited nano-luminescence spectroscopy of GaN surfacesand interfaces

Citation
Lj. Brillson et al., Low energy electron-excited nano-luminescence spectroscopy of GaN surfacesand interfaces, APPL SURF S, 175, 2001, pp. 442-449
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
175
Year of publication
2001
Pages
442 - 449
Database
ISI
SICI code
0169-4332(20010515)175:<442:LEENSO>2.0.ZU;2-9
Abstract
We have used low energy electron-excited nano-luminescence (LEEN) spectrosc opy to obtain electronic band gap, confined state, and deep level trap info rmation from GaN surfaces and buried interfaces on a nanometer scale. This local spectroscopy provides information available only indirectly by other electronic techniques. Using LEEN in combination with other surface science methods, we have probed the localized electronic states at GaN free surfac es, metal-CaN contacts, GaN/InGaN quantum wells, AlGaN/GaN pseudomorphic he terostructures. and GaN/sapphire template layers, Their properties are sens itive to the interface chemical composition, bonding, and atomic structure and in turn to the specifics of the epitaxial growth. The results highlight new methods for understanding and controlling electronic properties of GaN interfaces and their future applications, (C) 2001 Elsevier Science B,V. A ll rights reserved.