M. Tabe et al., Quantum confinement effects in Si quantum well and dot structures fabricated from ultrathin Silicon-on-insulator wafers, APPL SURF S, 175, 2001, pp. 613-618
Quantum confinement effects in two-dimensional(2D) Si and zero-dimensional
(OD) Si structures, fabricated from silicon-on-insulator wafers, have been
comparatively studied primarily by X-ray photoelectron spectroscopy (XPS),
focusing on the energy shifts of the valence band maximum (VBM). As a resul
t, it was found that the VBM obviously shifts toward higher binding energie
s during layer thinning of Si well and size reduction of Si dots, in accord
ance with quantum mechanical consideration. (C) 2001 Elsevier Science B.V.
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