Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films

Citation
N. Koch et al., Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films, APPL SURF S, 175, 2001, pp. 764-768
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
175
Year of publication
2001
Pages
764 - 768
Database
ISI
SICI code
0169-4332(20010515)175:<764:CPAMAE>2.0.ZU;2-T
Abstract
We have used ultraviolet photoelectron spectroscopy (UPS) and metastable at om electron spectroscopy (MAES) to study the changes in the valence electro nic structure of oligophenylenes upon the deposition of alkali metals. We h ave fabricated thin films of p-quarterphenyl (4P) and p-sexiphenyl (6P) by thermal evaporation under ultrahigh vacuum conditions, resulting in partly oriented organic films. Subsequently, increasing amounts of alkali metals ( Na, K, Rb, Cs in individual experiments) were deposited onto those in a ste pwise manner. After each step, UPS and MAES spectra were recorded. We find new emissions within the formerly empty energy-gap of the organic materials induced by the charge transfer from the alkali metals. These are attribute d to the formation of bipolarons. We find that the deexcitation probability of He-* (2(1)S) atoms on the doped organic surfaces exceeds that of He-* ( 2(3)S) by up to four times. (C) 2001 Elsevier Science B.V. All rights reser ved.