Characteristics of low-temperature poly-Si TFTs on Al/glass substrates

Citation
Y. Mishima et al., Characteristics of low-temperature poly-Si TFTs on Al/glass substrates, IEEE DEVICE, 48(6), 2001, pp. 1087-1091
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
48
Issue
6
Year of publication
2001
Pages
1087 - 1091
Database
ISI
SICI code
0018-9383(200106)48:6<1087:COLPTO>2.0.ZU;2-D
Abstract
The low-temperature poly-Si TFTs described here were fabricated on the Al/g lass substrates by anodic oxidation of Al. An Al layer on glass substrates can be used to control threshold voltage, improve stabilities, and suppress the temperature rise due to self-heating. The Al layer on glass, thus, ass uring the improved reliability of displays, using this type of TFT, effecti vely suppressed the self-heating effect of poly-Si TFTs on glass. The thres hold voltage of a TFT with an Al layer was more stable than that without an Al layer. These results were supported by numerical analysis.