Effect of internal reflections on the radiation properties and input impedance of integrated lens antennas Comparison between theory and measurements

This paper presents the effect of internal reflections on the beam pattern and input impedance of integrated lens antennas.-ii silicon lens was design ed and manufactured, and measurements mere conducted at a frequency of 100 (impedance) and 500 GHz (beam pattern). A frequency-dependence characteriza tion of the beam pattern clearly showed the existence,and impact of interna l reflections, The measurements confirmed that most of the frequency variat ions of the beam pattern could be attributed to internal reflections, as pr edicted by the model, An on-wafer measurement strategy for determining the antenna impedance at millimeter-wave frequencies is presented. The validity of the model was also proven by an excellent match of the input impedance measurements and predictions. Not only the level, but also the oscillation on the impedance curve was predicted accurately. Initial space qualificatio n was performed in the form of thermal cycling.