A physical design tool for built-in self-repairable RAMs

Authors
Chakraborty, K Kulkarni, S Bhattacharya, M Mazumder, P Gupta, A
Citation
K. Chakraborty et al., A physical design tool for built-in self-repairable RAMs, IEEE VLSI, 9(2), 2001, pp. 352-364
Citations number
24
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
ISSN journal
10638210 → ACNP
Volume
9
Issue
2
Year of publication
2001
Pages
352 - 364
Database
ISI
SICI code
1063-8210(200104)9:2<352:APDTFB>2.0.ZU;2-C
Abstract
In this paper, we present the description and evaluation of a novel physica l design tool, BISRAMGEN, that can generate reconfigurable and fault-tolera nt RAM modules. This tool, first proposed in [3], designs a redundant RAM a rray with accompanying built-in self-test (BIST) and built-in self-repair ( BISR) logic that can snitch out faulty rows and switch in spare rows. Built -in self-repair causes significant improvement in reliability, production y ield, and manufacturing cost of ASICs and microprocessors with embedded RAM s.