Microstructural aspects of island nucleation process in elastically relaxed LPOMVPE grown In0.2Ga0.8As/GaAs multilayer

Citation
D. Mogilyanski et al., Microstructural aspects of island nucleation process in elastically relaxed LPOMVPE grown In0.2Ga0.8As/GaAs multilayer, J PHYS D, 34(10A), 2001, pp. A19-A24
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
34
Issue
10A
Year of publication
2001
Pages
A19 - A24
Database
ISI
SICI code
0022-3727(20010521)34:10A<A19:MAOINP>2.0.ZU;2-P
Abstract
A strained superlattice composed of five bilayers of In0.2Ga0.8As/GaAs grow n on a (001) GaAs substrate was studied via comparison of the measured high -resolution reciprocal space maps near to the various substrate Bragg peaks with the theoretically modelled intensity distributions. Fourier synthesis was used to describe the strain field and the morphology of the nucleated islands. Modelling, which explains the presence of the side intensity maxim a, shows that the lateral compositional variation produces domains with enr iched In concentration surrounded by In depleted regions. The distribution of the strain field in both substrate and the multilayer suggests that the compositional modulation promotes nucleation of the islands with a skew ver tical correlation on the subsequent interfaces.