Three-dimensional reciprocal-space mapping of chemical vapour deposited diamond

The availability of high-precision diffractometers enables one to study in detail the reciprocal space surrounding chosen Bragg reflections from small crystals. Here we have applied three-dimensional reciprocal-space mapping to study individual grains in polycrystalline chemical vapour deposited dia mond grown on W and Mo substrates. Correlations between (a) the strain with in grains and (b) the crystallite size and/or orientation (microtexture) ha ve been investigated. The high angular resolution of the instrument has ena bled us to isolate individual crystallites in reciprocal space. The reducti on of the axial divergence reduces the size of the probe and hence partiall y eliminates the projection effect.