High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers

Citation
Bd. Fulthorpe et al., High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers, J PHYS D, 34(10A), 2001, pp. A203-A207
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
34
Issue
10A
Year of publication
2001
Pages
A203 - A207
Database
ISI
SICI code
0022-3727(20010521)34:10A<A203:HXDSOR>2.0.ZU;2-W
Abstract
The ability to distinguish between roughness and mosaic defect types in (00 1) and (111) oriented Fe/Au multilayers has been studied using synchrotron radiation. For the (001) orientation structures, the full-width at half-max imum of scans taken transverse to the 002 reciprocal lattice vector through the satellite diffraction peaks exhibit a parabolic dependence on the sate lite order which we interpret as arising from interfacial roughness. An add itional contribution, constant with satellite order, is identified with mos aic defects within the system. The observations are not fully consistent wi th an established theoretical defect model: the minimum in the parabolic fi t not occurring at the zero-order peak although the actual experimental min ima were found at this position. For the (111) oriented Fe/Au multilayers, no variation in the transverse width was found with satellite order. This w as attributed to the lower roughness, measured independently by grazing inc idence scattering.