Determining Young's modulus of conductive thin films by a thermal bend beam test

An experimental method used to measure the Young's modulus of the conductiv e thin film is proposed in this paper. This technology has utilized the ele ctrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. T he Young's modulus of conductive SnO2 thin film has been estimated by means of the formula and the thermal bend beam test presented.