Ed. Tabachnikova et al., The contribution of grain boundary dislocations to the plastic deformationof nanostructured titanium from the SD-effect of the yield stress, MAT SCI E A, 309, 2001, pp. 524-527
The deformation curves in uniaxial tension and compression at 300 K were st
udied for commercial grade Ti and for ultrafine-grained Ti with different n
anostructures produced by severe plastic deformation through equal channel
angular pressing (ECAP) and subsequent thermal treatment. It is found that
differences between the yield stresses in tension and compression (SD-effec
t) depend on the structural states of Ti and on the texture of the samples.
The SD-effect value differs considerably for samples strained along direct
ions parallel and perpendicular to the ECAP axis. The influence of the text
ure upon the yield stress under uniaxial compression has been studied at 30
0, 77, and 4.2 K. (C) 2001 Elsevier Science B.V. All rights reserved.