Field cooling induced changes in the antiferromagnetic structure of NiO films

Citation
W. Zhu et al., Field cooling induced changes in the antiferromagnetic structure of NiO films, PHYS REV L, 86(23), 2001, pp. 5389-5392
Citations number
23
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
86
Issue
23
Year of publication
2001
Pages
5389 - 5392
Database
ISI
SICI code
0031-9007(20010604)86:23<5389:FCICIT>2.0.ZU;2-J
Abstract
The magnetic anisotropy in antiferromagnetic 500 Angstrom thick NiO films, before and after the establishment of an exchange bias field with Co84Fe16 ferromagnetic layers, was measured using magnetic linear dichroism in soft x-ray absorption. Both < 111 > textured NiO and untextured NiO films show e xchange-bias induced in-plane magnetic anisotropy of nearly equal magnitude and with the Ni moment axis being nearly parallel to the exchange bias fie ld direction. These results represent the first observation of the key step in the exchange biasing process, namely, repopulation of the antiferromagn etic domains whose magnetization axis is closest to the exchange bias field direction.