Self-similarity and pattern selection in the roughening of binary liquid films

Citation
H. Hoppe et al., Self-similarity and pattern selection in the roughening of binary liquid films, PHYS REV L, 86(21), 2001, pp. 4863-4866
Citations number
21
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
86
Issue
21
Year of publication
2001
Pages
4863 - 4866
Database
ISI
SICI code
0031-9007(20010521)86:21<4863:SAPSIT>2.0.ZU;2-K
Abstract
Films of spinodally decomposing binary liquid mixtures show transient wetti ng of both confining interfaces by one of the phases, and rupture, with cha racteristic wavelength lambda (c) and time T-rupture, leading to flat dropl ets of the nonwetting phase encapsulated by the wetting phase. Over the ent ire range of film thicknesses d approximate to 100-3500 nm, we find T-ruptu re proportional to d(1.01 +/-0.08), indicating film structures that scale s elf-similarly with d, and find also that lambda (c) approximate to 60d(0.97 +/-0.03), the large prefactor suggesting a rupture wavelength which minimi zes the interfacial tension of the roughened film.