A method is described for evaluating the phosphorus content of electroless
nickel coatings by X-ray diffractometry (XRD) and differential scanning cal
orimetry (IPSC), The information obtained from XRD and DSC, including the a
ppearance of Ni(200) and Ni(220) peaks in the XRD pattern and the number of
transformations in the DSC curve, is used as an indication of phosphorus c
ontent. Compared with other methods, this technique has the advantage of be
ing simple and effective. At the same time, information about microstructur
e and microstructural changes during heating is obtained.