Topographic and phase-contrast imaging in atomic force microscopy

Phase-contrast imaging in the tapping mode atomic force microscopy (AFM) is a powerful method in surface characterization. This method can provide fin e details about rough surfaces, which are normally obscured in topographic imaging. To illustrate some of the capabilities of phase-contrast imaging, AFM studies of Pt/Ti/SiO2/Si and Pb(Zr0.52Ti0.48)O-3 (PZT) films were carri ed out. Phase-contrast imaging revealed fine details of their microstructur es, including grain boundaries, triple junctions and twinning, which could not be detected by topographic imaging. The studies showed that phase-contr ast imaging is capable of providing superior information about surface char acteristics when compared to the standard topographic imaging. (C) 2000 Els evier Science B.V. All rights reserved.