A yield stress scaling function for electrorheological fluids

Authors
Choi, HJ Cho, MS Kim, JW Kim, CA Jhon, MS
Citation
Hj. Choi et al., A yield stress scaling function for electrorheological fluids, APPL PHYS L, 78(24), 2001, pp. 3806-3808
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
24
Year of publication
2001
Pages
3806 - 3808
Database
ISI
SICI code
0003-6951(20010611)78:24<3806:AYSSFF>2.0.ZU;2-4
Abstract
The yield stress dependence on electric field strength for electrorheologic al (ER) fluids is examined. A proposed scaling function incorporates both t he polarization and conductivity models. Proper scaling allows yield stress data for ER fluids to collapse onto a single curve for a broad range of el ectric field strengths. (C) 2001 American Institute of Physics.