Multilayer ferroelectric and ferromagnetic thin films were fabricated with
the following composition and structure. La0.67Sr0.33MnOx /(Pb, La)(Ca, Ti)
O-3 (LSMO/PLCT) and (Pb, La)(Ca, Ti)O-3/La0.67Sr0.33MnOx (PLCT/LSMO), with
an intention of creating a device of new concept. The films were fabricated
using metalorganic deposition. The LSMO/PLCT structured films exhibit the
ferroelectric properties while the PLCT/LSMO structured films exhibit the f
erromagnetic properties. Compared with the PLCT/Pt structure, the capacitan
ce-frequency and can delta -frequency properties of the LSMO/PLCT structure
are degraded. The magnetoresistance of the PLCT/LSMO structure was measure
d and the results show that the metal-insulator transition temperature is l
ower than that of the LSMO/SiO2/Si structure. Furthermore, the magnetoresis
tance at 77 K and at the transition temperature for the PLCT/LSMO structure
is higher than that of the LSMO/SiO2/Si structure. These effects can be ex
plained by the piezoelectricity of the PLCT film deposited on the LSMO laye
r. In addition, these effects demonstrate that the ferromagnetic properties
can be controlled by the ferroelectric properties of the multilayer films.
(C) 2001 American Institute of Physics.