The critical current density J(c) and the n-value have been studied from 40
K to critical temperature for four types of Bi-system 2223 tapes with diffe
rent sheaths. The experimental results demonstrate that the change of J(c)
can be divided into three parts and the n-value has some decrease with a de
crease in temperature. In engineering applications, a proper working temper
ature can be selected to satisfy the practical requirement. Furthermore, th
e temperature effects on critical stress for Ag-sheath tape was also studie
d. The results demonstrate that the critical stress does not change monoton
ically with a decrease in temperature. It increases first, then decreases w
ith the further decrease in temperature.