THE USE OF IMAGE-ANALYSIS TO CHARACTERIZE AGGREGATES IN A SHEAR FIELD

Citation
C. Bower et al., THE USE OF IMAGE-ANALYSIS TO CHARACTERIZE AGGREGATES IN A SHEAR FIELD, Colloids and surfaces. A, Physicochemical and engineering aspects, 127(1-3), 1997, pp. 105-112
Citations number
20
Categorie Soggetti
Chemistry Physical
ISSN journal
09277757
Volume
127
Issue
1-3
Year of publication
1997
Pages
105 - 112
Database
ISI
SICI code
0927-7757(1997)127:1-3<105:TUOITC>2.0.ZU;2-W
Abstract
A means of morphological characterization of flocculated suspensions i n a shear field is described. By use of image analysis combined with r heometry it was possible to measure the size and fractal dimension of solid aggregates in non-aqueous suspensions under variable shear stres s. This enabled structural changes such as alignment and aggregate bre ak-up to be observed and quantified. Studies of the aggregation kineti cs were also performed by monitoring the size increase of aggregates, after the relaxation of an applied shear stress sufficient to disperse the aggregates. The technique is illustrated by measurements on lacto se aggregates in 1,1,2-trichlorotrifluoroethane, a system relevant to the behaviour of inhalation aerosols. Aggregate size R was rapidly red uced by the application of shear stresses s up to 1 N m(-2) followed b y a more gradual decrease at greater stresses. The average aggregate s ize showed good agreement with an empirical law of the form R similar to s(-1/3), which enabled estimates of the aggregate binding energy to be obtained. Boundary fractal dimension showed only a slight reductio n from 1.4 to 1.3 over the same range of shear stress, indicating that the rugged aggregate structure and self similarity were largely prese rved during disruption. Measurement of the formation kinetics and frac tal dimension of aggregates showed a correlation between the resultant aggregate morphology and the formation rate which was in agreement wi th existing theories of fractal aggregation kinetics. (C) 1997 Elsevie r Science B.V.