TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATIONS OF DEFECTS IN MOLECULAR-BEAM EPITAXY-GROWN OXIDE-FILMS

With a view to increasing the superconductive transition temperature o f thin films of La2CuO4 grown by molecular beam epitaxy, films were gr own on substrates of lattice parameters such that the film-substrate m isfit became small and tensile, or compressive. The microstructure of these films was investigated using transmission electron microscopy an d qualitative correlations with physical properties suggested.