A method to fabricate high T-c superconducting films exhibiting a smal
l surface roughness has been developed, using conventional de inverted
cylindrical magnetron sputtering. The method is based on the periodic
modulation of the sputtering power during the deposition process; acc
ordingly, deposition rate periodically reaches values as low as the 25
% of the full power value. YBCO films, fabricated following such a mod
ulated deposition process, have been electrically characterized and st
ructurally investigated by X-ray diffractometry. The surface morpholog
y has been analyzed by atomic force and scanning electron microscopy.
Surface roughness as low as 2 nm have been obtained by using a modulat
ion period of 30 s.