STRESS AND MICROSTRUCTURE IN YBACUO THIN-FILMS ON MGO AND SITIO3 SUBSTRATES STUDIED BY X-RAY-DIFFRACTION AND BENDING TESTS

Authors
AUZARY S BADAWI F BIMBAULT L RABIER J GABORIAUD RJ
Citation
S. Auzary et al., STRESS AND MICROSTRUCTURE IN YBACUO THIN-FILMS ON MGO AND SITIO3 SUBSTRATES STUDIED BY X-RAY-DIFFRACTION AND BENDING TESTS, Journal of alloys and compounds, 251(1-2), 1997, pp. 37-40
Citations number
10
Categorie Soggetti
Chemistry Physical","Metallurgy & Metallurigical Engineering","Material Science
Journal title
Journal of alloys and compounds → ACNP
ISSN journal
09258388
Volume
251
Issue
1-2
Year of publication
1997
Pages
37 - 40
Database
ISI
SICI code
0925-8388(1997)251:1-2<37:SAMIYT>2.0.ZU;2-E
Abstract
Stress-strain tensors and stress-free lattice parameters related to th e microstructure is studied in YBCO thin films deposited by pulsed-las er ablation on MgO and SrTiO3 substrates by means of X-ray diffraction and bending test measurements. The results show that the lattice of t he thin him deposited on SrTiO3 is under compression in the (a,b) plan e and the stress-free lattice parameters of this film are always lower than the parameters of the bulk material.