B. Eustache et al., MBE GROWTH OF COMPOUNDS ON THE COPPER RICH SIDE OF THE (SR,CA)CUO SYSTEM, Journal of alloys and compounds, 251(1-2), 1997, pp. 240-242
Thins films belonging to the copper rich family in the (Sr,Ca)-Cu-O sy
stem have been synthesized using Molecular Beam Epitaxy (MBE) depositi
on. The growth conditions have been optimized on two different substra
tes, MgO (100) and SrTiO, (100). We discuss in this paper the variatio
ns of the electron diffraction pattern (RHEED) during the growth. The
films obtained present a single orientation with good crystallization.
The average composition measured by Rutherford Backscattering Spectro
scopy (RES) is (Sr,Cn)(0.6)CuOz. This stoichiometry is close to the co
mposition expected for the first members of the Spin Ladders homologou
s series Srn-1Cun+1O2n. High resolution electron microscopy (HREM) and
X-ray diffraction measurements on a four circles diffractometer are i
n progress. Preliminary results confirm that the structure is consiste
nt with spin-ladders structures. Typical room temperature resistivity
is of the order of 0.5 m Omega cm. The search fof superconducting prop
erties in these compounds is discussed.