B. Schulte et al., INDUSTRIAL METALORGANIC CHEMICAL-VAPOR-DEPOSITION TECHNOLOGY FOR THE GROWTH OF YBA2CU3O7-DELTA, Journal of alloys and compounds, 251(1-2), 1997, pp. 360-365
MOCVD is the established technology for the mass production of compoun
d semiconductors for e.g. opts-electronic devices. To transfer the MOC
VD technology for HTS films to the standard MOCVD technology used in s
emiconductor production two major challenges have to be solved: 1. the
Ba-precursor instability and 2. the demonstration of uniform depositi
on of HTS films onto large area substrates. This paper presents an ind
ustrial MOCVD process solving these challenges using a new stable fluo
rinated Ba-precursor and a Gas Foil Rotation(R) susceptor. On a 2 inch
diameter substrate area state-of-the-art YBCO thin films LI ere fabri
cated having a thickness uniformity of 1% and compositional uniformity
of 2% and 5% for Y/Ba and Cu/Ba, respectively. The films show a surfa
ce morphology with low defect density (<5 within 100 mu m(2)) and exce
llent superconducting properties (Ti (50%)>90 K, j(c) (T=77 K, (B=0T)>
5x10(6) A cm(-2)). The residual contamination by fluorine was determin
ed by SIMS to be less than 250 ppm. This gives the strong evidence tha
t this industrial process can be transferred to the Multiwafer Planeta
ry Reactors(R) for mass production.