Monte Carlo simulations of microstrip lines with random substrate impurity
are performed. Each realization of current distribution on the microstrip l
ine with substrate impurity is calculated by the hybrid finite element meth
od/multilevel fast multipole algorithm. After taking the ensemble average o
f all the realizations, the super-resolution estimation of signal parameter
s via rotational invariance technique algorithm is employed to extract the
characteristic parameters of the transmission line from the current distrib
ution. Comparisons of our numerical results and previously published result
s for the conventional microstrip line with homogeneous substrate confirm t
he validity, accuracy, and efficiency of our simulation tool. Our Monte Car
lo simulations demonstrate that the effect of substrate impurity on the cha
racteristics of a microstrip line can be quite accurately estimated by repl
acing the inhomogeneous substrate with a homogeneous one whose dielectric c
onstant is the averaged value for different materials weighted by their vol
ume ratios. This simple estimation approach, however, does not apply to the
attenuation constant of the line due to the effect of finite substrate wid
th. (C) 2001 John Wiley sr Sons, Inc.